Skip to main menu
Scroll to content
PL
|
EN
Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit
https://bibliotekanauki.pl
Search
Browse
About
test
PL
EN
BibTeX
PN-ISO 690:2012
Chicago
Chicago (Author-Date)
Harvard
ACS
ACS (no art. title)
IEEE
Preferences
Polski
English
Language
enabled
[disable]
Abstract
10
20
50
100
Number of results
Tools
PL
EN
BibTeX
PN-ISO 690:2012
Chicago
Chicago (Author-Date)
Harvard
ACS
ACS (no art. title)
IEEE
Link to site
Copy
Journal
International Journal of Electronics and Telecommunications
2020
|
66
|
3
|
Article title
Determination of the Optimal Threshold Value and Number of Keypoints in Scale Invariant Feature Transform-based Copy-Move Forgery Detection
Authors
Isnanto R Rizal
,
Ajub Ajulian Zahra
,
Imam Santoso
,
Muhammad Salman Lubis
,
Isnanto R Rizal
,
Ajub Ajulian Zahra
,
Imam Santoso
,
Muhammad Salman Lubis
Content
Full texts:
Download
Download
Title variants
PL
Determination of the Optimal Threshold Value and Number of Keypoints in Scale Invariant Feature Transform-based Copy-Move Forgery Detection
Languages of publication
EN
Abstracts
Keywords
EN
forgery
Gaussian noise
feature extraction
pattern matching
Euclidean distance
PL
Nauki Techniczne
Publisher
Polska Akademia Nauk
Journal
International Journal of Electronics and Telecommunications
Year
2020
Volume
66
Issue
3
Physical description
Contributors
author
Isnanto R Rizal
author
Ajub Ajulian Zahra
author
Imam Santoso
author
Muhammad Salman Lubis
author
Isnanto R Rizal
author
Ajub Ajulian Zahra
author
Imam Santoso
author
Muhammad Salman Lubis
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.oai-journals-pan-pl-117108
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.