Acta Physica Polonica A - Volume 124, Issue 2 (2013) - PSJD - Yadda

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Publisher

Institute of Physics, Polish Academy of Sciences

Journal

Acta Physica Polonica A

Year

2013

Volume

124

Issue

2

Identifiers

Cover

Volume contents

2
- article: Jan Czochralski and His Method of Crystal Growth (Pajączkowska A.), p. 171-172
- article: Czochralski Method of Crystal Growth in the Scientific Literature: An Informetric Study (Sangwal K.), p. 173-180
- article: A Review of the Automation of the Czochralski Crystal Growth Process (Winkler J., Neubert M., Rudolph J.), p. 181-192
- article: Experimental Modelling of Czochralski Melt Flow with a Slow Crystal Dummy Rotation (Haslavsky V., Gelfgat A., Kit E.), p. 193-197
- article: Seed Production and Melt Replenishment for the Czochralski Growth of Silicon Germanium (Armour N., Dost S.), p. 198-212
- article: Will Czochralski Growth of Sapphire Once Again Prevail? (Bruni F., Liu C., Stone-Sundberg J.), p. 213-218
- article: Constitutional Supercooling in Czochralski Growth οf Heavily Doped Silicon Crystals (Friedrich J., Stockmeier L., Müller G.), p. 219-226
- article: Development of Crystal Growth Technique of Silicon by the Czochralski Method (Kakimoto K.), p. 227-230
- article: Improved Czochralski Growth of Germanium Single Crystals from a Melt Covered by Boron Oxide (Taishi T., Yonenaga I., Hoshikawa K.), p. 231-234
- article: Czochralski-Grown Silicon Crystals for Microelectronics (Bukowski A.), p. 235-238
- article: Si_{1-x}Ge_{x} Single Crystals Grown by the Czochralski Method: Defects and Electrical Properties (Argunova T., Je J., Kostina L., Rozhkov A., Grekhov I.), p. 239-243
- article: High-Pressure Treatment up to 25~GPa of Czochralski Grown Si Samples Containing Different Admixtures and Defects (Shchennikov V., Shchennikov V., Korobeynikov I., Morozova N.), p. 244-249
- article: Czochralski Growth and Properties of Scintillating Crystals (Yoshikawa A., Chani V., Nikl M.), p. 250-264
- article: Czochralski-Based Growth and Characteristics of Selected Novel Single Crystals for Optical Applications (Shimamura K., Víllora E.), p. 265-273
- article: Growth of Oxide Laser Crystals by Czochralski Method (Zharikov E., Lis D., Subbotin K., Dudnikova V., Zaitseva O.), p. 274-285
- article: A Short Review on Fluoride Laser Crystals Grown by Czochralski Method at IPEN (Baldochi S., Ranieri I.), p. 286-294
- article: Growth and Investigation of Nd_{1-x}Sm_{x}ScO_3 and Sm_{1-x}Gd_{x}ScO_3 Solid-Solution Single Crystals (Uecker R., Klimm D., Bertram R., Bernhagen M., Schulze-Jonack I., Brützam M., Kwasniewski A., Gesing T., Schlom D.), p. 295-300
- article: Growth and Characterization of Vanadate Laser Crystals (Yu H., Zhang H., Wang J.), p. 301-304
- article: Development of Growth Technologies for the Photonic Single Crystals by the Czochralski Method at Institute for Single Crystals, NAS of Ukraine (Kosmyna M., Nazarenko B., Puzikov V., Shekhovtsov A.), p. 305-313
- article: Growing Large Size Complex Oxide Single Crystals by Czochralski Technique for Electronic Devices (Solskii I., Sugak D., Vakiv M.), p. 314-320
- article: Czochralski Growth and Optical Properties οf (Lu_{x}Gd_{1-x})_2SiO_5 Solid Solution Crystals Single Doped with Sm^{3+} and~Dy^{3+} (Ryba-Romanowski W., Strzęp A., Głowacki M., Lisiecki R., Solarz P., Domagala J.), p. 321-328
- article: Low Temperature Crystal Structure Behaviour of Complex Yttrium Aluminium Oxides YAlO_3 and Y_3Al_5O_{12} (Senyshyn A., Vasylechko L.), p. 329-335
- article: Single-Crystal Growth of f-Electron Intermetallics in a Tetra-Arc Czochralski Furnace (Szlawska M., Kaczorowski D.), p. 336-339
- article: Czochralski Method for Crystal Growth οf Reactive Intermetallics (Talik E., Oboz M.), p. 340-343
- article: Czochralski Growth of Decagonal AlCoNi Quasicrystals from Al-rich Solution (Meisterernst G., Bauer B., Gille P.), p. 344-349
- article: Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method (Wierzchowski W., Wieteska K., Malinowska A., Wierzbicka E., Lefeld-Sosnowska M., Świrkowicz M., Łukasiewicz T., Pajączkowska A., Paulmann C.), p. 350-359
- article: X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method (Lefeld-Sosnowska M., Malinowska A.), p. 360-371
- article: Development of Radiation Hard Particle Detectors Made of Czochralski Grown Silicon (Härkönen J.), p. 372-376

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