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Publisher
Institute of Physics, Polish Academy of Sciences
Journal
Acta Physica Polonica A
Year
1999
Volume
96
Issue
5
Identifiers
Cover
Volume contents
5
article:
Proceedings of the XXVIII International School on Physics of Semiconducting Compounds. Preface.
, p. 507-510
article:
Cavity-Polariton Effects in II-VI Microcavities
(
André R.
,
Boeuf F.
,
Heger D.
,
Dang L.
,
Romestain R.
,
Bleuse J.
,
Müller M.
), p. 511-524
article:
Photoemission Study of the Electronic Structure of Semiconducting Compounds
(
Fujimori A.
,
Okabayashi J.
,
Mamiya K.
), p. 525-533
article:
Excitation of Deep Defects by Intense Terahertz Radiation
(
Ganichev S.
), p. 535-544
article:
Spectroscopy of Few-Electron Quantum Dots
(
Heitmann D.
,
Gudmundsson V.
,
Rolf L.
,
Schüller C.
,
Steinebach C.
,
Ulrichs E.
), p. 545-557
article:
Spectroscopy of Charged Donors and Many-Electron Effects in Semiconductor Quantum Wells
(
McCombe B.
,
Jiang Z.
,
Tischler J.
,
Weinstein B.
,
Hawrylak P.
), p. 559-572
article:
Ultrafast Processes in Semiconductor Structures
(
Viña L.
), p. 573-592
article:
Composite Fermions and the Fractional Quantum Hall Effect
(
Wójs A.
,
Quinn J.
), p. 593-602
article:
Density of States for Ballistic Electrons in Electric and Magnetic Fields
(
Zawadzki W.
,
Kubisa M.
), p. 603-612
article:
Defects and Defect Reactions in Semiconductor Nitrides
(
Van de Walle C.
,
Neugebauer J.
,
Stampfl C.
,
McCluskey M.
,
Johnson N.
), p. 613-627
article:
Structural and Magnetic Dynamical Properties of Solids. Experimental Approach with Inelastic Neutron Scattering
(
Hennion B.
), p. 629-640
article:
Transport in Quantum Structures of Diluted Magnetic Semiconductors
(
Jaroszyński J.
), p. 641-650
article:
Semimagnetic Semiconductors
(
Gaj J.
), p. 651-664
article:
Fluorescence Correlation and Low Temperature Linewidth of Single Defect Centers in Diamond
(
Dräbenstedt A.
,
Tietz C.
,
Jelezko F.
,
Wrachtrup J.
,
Kilin S.
,
Nizovtzev A.
), p. 665-675
article:
Kondo-Lattice Metals and Semiconductors with Compensated Magnetic Moments: a Brief Overview
(
Spałek J.
,
Doradziński R.
), p. 677-688
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