X-Ray Resonant Magnetic Scattering: Application to Thin Films and Multilayers

• Authors: D. Raoux , N. Jaouen , J.M. Tonnerre , E. Bontempi
• Languages of publication: EN

Abstracts

EN

This paper reports on the use of a new technique to investigate the magnetic properties of thin films, multilayers and artificial structures, the X-ray resonant magnetic scattering at small values of the scattering vector. It can be used either by registering the reflectivity pattern or in a diffraction mode. In comparison with magneto-optical Kerr effect or neutron scattering, it offers an atomic selectivity due to the resonant excitation of a core electron, and even an electronic shell one. Examples are presented mainly in the soft X-range allowing to probe the 3d band of transition metals. They demonstrate the promising possibilities of the method to measure the magnetic moments carried by each of the atomic components in complex systems, as well as their distribution through thin layers, with an atomic resolution.

Keywords

EN

71.28.+d; 78.70.Ck; 71.27.+a

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2000
• Volume: 98
• Issue: 5
• Pages: 483-494

Dates

published

2000-11

Contributors

author

D. Raoux

• Laboratoire de Cristallographie, CNRS and UJF B.P. 166, 38042 Grenoble Cedex 09, France

author

N. Jaouen

• Laboratorio di Strutturistica Chimica, Universitá di Brescia Via Branze 38, 25123 Brescia, Italy

author

J.M. Tonnerre

• Laboratoire de Cristallographie, CNRS and UJF B.P. 166, 38042 Grenoble Cedex 09, France

author

E. Bontempi

• Laboratorio di Strutturistica Chimica, Universitá di Brescia Via Branze 38, 25123 Brescia, Italy