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2000 | 97 | 3 | 527-530
Article title

The Improvement of Atomic Force Microscope Suitable for Magnetic Domain Structure Measurements

Content
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Languages of publication
EN
Abstracts
EN
Based on commercial Burleigh METRIS^{TM}-2000 Atomic Force Microscope two methods of magnetic force measurements were realised. The developed system was successfully applied for study of magnetic structure of both YIG-garnet and CoNi/Pt magneto-optic multilayers.
Keywords
EN
Publisher

Year
Volume
97
Issue
3
Pages
527-530
Physical description
Dates
published
2000-03
Contributors
author
  • Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland
  • Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland
  • Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland
author
  • Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv97z341kz
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