The Improvement of Atomic Force Microscope Suitable for Magnetic Domain Structure Measurements

• Authors: I. Sveklo , W. Dobrogowski , M. Kisielewski , A. Maziewski
• Languages of publication: EN

Abstracts

EN

Based on commercial Burleigh METRIS^{TM}-2000 Atomic Force Microscope two methods of magnetic force measurements were realised. The developed system was successfully applied for study of magnetic structure of both YIG-garnet and CoNi/Pt magneto-optic multilayers.

Keywords

EN

75.70.-i; 75.30.Pd; 61.16.Ch

Discipline

• 75.70.-i: Magnetic properties of thin films, surfaces, and interfaces(for magnetic properties of nanostructures, see 75.75.-c)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2000
• Volume: 97
• Issue: 3
• Pages: 527-530

Dates

published

2000-03

Contributors

author

I. Sveklo

• Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland

author

W. Dobrogowski

• Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland

author

M. Kisielewski

• Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland

author

A. Maziewski

• Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland

Identifiers

DOI

10.12693/APhysPolA.97.527