Influence of Film Thickness on the Microstructure and Magnetic Properties of Finemetic Thin Films

• Authors: R. Dlugoš , P. Sovák , J. Balcerski , J. Füzer , P. Kollár
• Languages of publication: EN

Abstracts

EN

The aim of this work was to study the influence of film thickness on the structure and magnetic properties of finemetic thin films after annealing. Thin films with the various thickness (from 20 nm up to 700 nm) were prepared by DC sputtering method. The heat treatments of the films for further structural and magnetic observations were performed at the temperature range 300-500°C for 15 min in vacuum furnace. Structural observations were carried out by transmission electron microscopy. Coercivity was determined from hysteresis loops traced with fluxmeter and Kerr magnetooptical hysteresisgraph. All the experimental results confirm a different magnetic behaviour of the thin films according to their thickness.

Keywords

EN

68.55.Jk; 73.50.Jt; 75.70.Ak

Discipline

• 75.70.Ak: Magnetic properties of monolayers and thin films
• 73.50.Jt: Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2000
• Volume: 97
• Issue: 3
• Pages: 447-450

Dates

published

2000-03

Contributors

author

R. Dlugoš

• Faculty of Science, P.J. Šafárik University, Park Angelinum 9, 041 54 Košice, Slovakia

author

P. Sovák

• Faculty of Science, P.J. Šafárik University, Park Angelinum 9, 041 54 Košice, Slovakia

author

J. Balcerski

• Department of Solid State Physics, University of Łódź, Pomorska 149/153, 90-236 Łódź, Poland

author

J. Füzer

• Faculty of Science, P.J. Šafárik University, Park Angelinum 9, 041 54 Košice, Slovakia

author

P. Kollár

• Faculty of Science, P.J. Šafárik University, Park Angelinum 9, 041 54 Košice, Slovakia

Identifiers

DOI

10.12693/APhysPolA.97.447