Neutron Reflectometry Studies of Thin Films and Multilayered Materials

• Authors: C. Majkrzak
• Languages of publication: EN

Abstracts

EN

Neutron reflectometry is an important technique for studying the composition and structure of thin films and layered media on a nanometer scale. Neutrons are particularly useful as probes of organic and magnetic materials since the information that can be obtained is often unique. Furthermore, the fact that neutrons traverse relatively large distances in single crystalline materials, such as silicon, permit investigations in diverse sample environments. The fundamental theoretical principles and experimental methodology of neutron reflectometry are presented, in addition to several illustrative examples of measurements relevant to polymer science, biology, electrochemistry, and magnetism.

Keywords

EN

61.12.-q

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1999
• Volume: 96
• Issue: 1
• Pages: 81-99

Dates

published

1999-07

Contributors

author

C. Majkrzak

• Center for Neutron Research, National Institute of Standards & Technology, Gaithersburg, Maryland, 20899, USA

Identifiers

DOI

10.12693/APhysPolA.96.81