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1999 | 96 | 1 | 81-99
Article title

Neutron Reflectometry Studies of Thin Films and Multilayered Materials

Authors
Content
Title variants
Languages of publication
EN
Abstracts
EN
Neutron reflectometry is an important technique for studying the composition and structure of thin films and layered media on a nanometer scale. Neutrons are particularly useful as probes of organic and magnetic materials since the information that can be obtained is often unique. Furthermore, the fact that neutrons traverse relatively large distances in single crystalline materials, such as silicon, permit investigations in diverse sample environments. The fundamental theoretical principles and experimental methodology of neutron reflectometry are presented, in addition to several illustrative examples of measurements relevant to polymer science, biology, electrochemistry, and magnetism.
Keywords
EN
Publisher

Year
Volume
96
Issue
1
Pages
81-99
Physical description
Dates
published
1999-07
Contributors
author
  • Center for Neutron Research, National Institute of Standards & Technology, Gaithersburg, Maryland, 20899, USA
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv96z106kz
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