MBE Growth and Properties of GaMnAs(100) Films

• Authors: J. Sadowski , J. Domagała , J. Bąk- Misiuk , K. Świątek , J. Kanski , L. Ilver , H. Oscarsson
• Languages of publication: EN

Abstracts

EN

We present here the results of measurements of structural and electronic properties of GaMnAs - a new diluted magnetic semiconductor system. This ternary III-V-Mn compound with the Mn content as high as 7% was obtained for the first time (by means of molecular beam epitaxial growth) by Ohno, Munekata et al. and the studies of its properties are not completed until now. We did the high resolution X-ray diffraction investigations and photoemission measurements of the samples with Mn content varied from about 0.1% up to 5%. The crystalline perfection of the ternary GaMnAs compound is very high - full width at half maximum of GaMnAs (400) Bragg reflections are of order of 50 arcseconds and the layers are fully strained to the GaAs(100) substrate. In photoemission experiments we traced the contribution of Mn 3d states to the band structure of GaMnAs ternary compound.

Keywords

EN

81.15.Hi; 79.60.Bm; 71.55.Eq

Discipline

• 81.15.Hi: Molecular, atomic, ion, and chemical beam epitaxy
• 71.55.Eq: III-V semiconductors
• 79.60.Bm: Clean metal, semiconductor, and insulator surfaces

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1998
• Volume: 94
• Issue: 3
• Pages: 509-513

Dates

published

1998-09

Contributors

author

J. Sadowski

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

J. Domagała

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

J. Bąk- Misiuk

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

K. Świątek

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

J. Kanski

• Department of Physics, Chalmers University of Technology and Goteborg University 412 96 Goteborg, Sweden

author

L. Ilver

• Department of Physics, Chalmers University of Technology and Goteborg University 412 96 Goteborg, Sweden

author

H. Oscarsson

• Department of Physics, Chalmers University of Technology and Goteborg University 412 96 Goteborg, Sweden

Identifiers

DOI

10.12693/APhysPolA.94.509