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An approach is proposed to estimate separately parameters of homogeneous and inhomogeneous broadenings from an optical reflection line of a quasi-2D exciton. A phenomenological model is proposed to take into account statistically an inhomogeneous broadening of the exciton resonant spectra. The concept is applied to study a modulation-doped heterostructures with a single quantum well CdTe/CdMgTe. From exciton reflection lines taken in a magnetic field the temperature-dependent homogeneous and inhomogeneous broadening parameters as well as the exciton radiative decay rate are measured.