Nanostructuring and Hardness Investigations of Thin Films by Scanning Force Microscopy

• Authors: M. Nowicki , A. Richter , R. Ries , M. Oszwałdowski
• Languages of publication: EN

Abstracts

EN

The scanning force microscope was used to scratch thin films and to write nanoscale pattern on surfaces as well as to perform nanoindentation for hardness measurements. Different thin film materials such as C_{60} films, diamond-like carbon, metals and semiconducting films have been investigated.

Keywords

EN

61.16.Ch; 68.35.-p

Discipline

• 68.35.-p: Solid surfaces and solid-solid interfaces: structure and energetics

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1998
• Volume: 93
• Issue: 2
• Pages: 437-441

Dates

published

1998-02

Contributors

author

M. Nowicki

• Institute of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland

author

A. Richter

• Department of Physics and Technology, Technische Fachhochschule Wildau Bahnhofstr. 1, 15745 Wildau, Germany

author

R. Ries

• Department of Physics and Technology, Technische Fachhochschule Wildau Bahnhofstr. 1, 15745 Wildau, Germany

author

M. Oszwałdowski

• Institute of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland

Identifiers

DOI

10.12693/APhysPolA.93.437