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1998 | 93 | 2 | 437-441
Article title

Nanostructuring and Hardness Investigations of Thin Films by Scanning Force Microscopy

Content
Title variants
Languages of publication
EN
Abstracts
EN
The scanning force microscope was used to scratch thin films and to write nanoscale pattern on surfaces as well as to perform nanoindentation for hardness measurements. Different thin film materials such as C_{60} films, diamond-like carbon, metals and semiconducting films have been investigated.
Keywords
EN
Publisher

Year
Volume
93
Issue
2
Pages
437-441
Physical description
Dates
published
1998-02
Contributors
author
  • Institute of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland
author
  • Department of Physics and Technology, Technische Fachhochschule Wildau Bahnhofstr. 1, 15745 Wildau, Germany
author
  • Department of Physics and Technology, Technische Fachhochschule Wildau Bahnhofstr. 1, 15745 Wildau, Germany
  • Institute of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv93z224kz
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