Local Adhesive Surface Properties Studied by Force Microscopy

• Authors: M. Lekka , J. Lekki , M. Marszałek , Z. Stachura , B. Cleff
• Languages of publication: EN

Abstracts

EN

Scanning force microscopy was used in the contact mode to determine the adhesion force between a mica surface and a silicon nitride tip. The measurements were performed in an aqueous solution of sodium and calcium chlorides. The adhesion force according to the Derjaguin-Landau-Verwey- Overbeek theory depends on the competition between two kinds of forces: van der Waals and electrostatic "double layer". Two different curves of adhesion force versus salt concentration were obtained from the experiment with monovalent and divalent ions. The tip-surface adhesion force was determined from a statistical analysis of data obtained from the force vs. distance retracting curves.

Keywords

EN

68.35.Gy

Discipline

• 68.35.Gy: Mechanical properties; surface strains(for strain induced piezoelectric fields, see 77.65.Ly; for strain effects on ferroelectric phase transitions, see 77.80.bn)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1998
• Volume: 93
• Issue: 2
• Pages: 421-424

Dates

published

1998-02

Contributors

author

M. Lekka

• Institute of Nuclear Physics, Radzikowskiego 152, 32-341 Cracow, Poland

author

J. Lekki

• Institute of Nuclear Physics, Radzikowskiego 152, 32-341 Cracow, Poland

author

M. Marszałek

• Institute of Nuclear Physics, Radzikowskiego 152, 32-341 Cracow, Poland

author

Z. Stachura

• Institute of Nuclear Physics, Radzikowskiego 152, 32-341 Cracow, Poland

author

B. Cleff

• Institute of Nuclear Physics, Wilhelm-Klemm-Str. 9, 48-149 Münster, Germany

Identifiers

DOI

10.12693/APhysPolA.93.421