Stm Observed Surface Structures and Magnetic Properties of MBE-Grown Metallic Thin Films

• Authors: R. Kalinowski , L. Baczewski , A. Wawro , C. Meyer , J. Raułuszkiewicz
• Languages of publication: EN

Abstracts

EN

Rare-earth epitaxial thin films of Tb and Gd of the thicknesses between 2 nm and 16 nm were deposited by means of molecular beam epitaxy method. The roughness of the rare-earth films measured by scanning tunneling microscopy was found to be in the range of 1-4.5 nm. The influence of the roughness on the dipolar anisotropy and magnetocrystalline surface anisotropy was estimated. The magnetic measurements have shown that the Gd layers deposited on the Y buffer layers had an easy plane anisotropy. However, for 2 nm thick Gd layer deposited on W buffer layer the perpendicular anisotropy was observed. According to the roughness analysis the possible sources of the perpendicular anisotropy in this sample is mainly the magnetoelastic anisotropy, but the presence of the magnetocrystalline surface anisotropy also cannot be neglected.

Keywords

EN

75.70.Ak; 68.55.-a; 68.60.Dv

Discipline

• 68.60.Dv: Thermal stability; thermal effects
• 75.70.Ak: Magnetic properties of monolayers and thin films
• 68.55.-a: Thin film structure and morphology(for methods of thin film deposition, film growth and epitaxy, see 81.15.-z)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1998
• Volume: 93
• Issue: 2
• Pages: 409-413

Dates

published

1998-02

Contributors

author

R. Kalinowski

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warsaw, Poland

author

L. Baczewski

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warsaw, Poland

author

A. Wawro

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warsaw, Poland

author

C. Meyer

• Laboratoire de Magnétisme L. Néel, CNRS, 38042 Grenoble Cedex 9, France

author

J. Raułuszkiewicz

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warsaw, Poland

Identifiers

DOI

10.12693/APhysPolA.93.409