Applications of Scanning Tunneling Microscopy To Solid State Physics

H. van Kempen; E. Boon; M. van der Wielen; J. Wildöer; M. Prins; R. Jansen; R. Schad

doi:10.12693/APhysPolA.93.323

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Journal

Acta Physica Polonica A

1998 | 93 | 2 | 323-331

Article title

Applications of Scanning Tunneling Microscopy To Solid State Physics

Authors

H. van Kempen , E. Boon , M. van der Wielen , J. Wildöer , M. Prins , R. Jansen , R. Schad

Content

http://przyrbwn.icm.edu.pl/APP/PDF/93/a093z2p08.pdf [remote]

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Abstracts

Due to the dependence of the tunnel current to material properties like work function, density of states, and spin polarization the scanning tunneling microscope can be used to study a number of solid state physics problems. This will be illustrated with some examples. The presented examples have in common that also the role of the tip properties have to be taken explicitly into account.

Keywords

61.16.Ch 68.35.Dv 71.55.Eq

Publisher

Institute of Physics, Polish Academy of Sciences

Journal

Acta Physica Polonica A

Year

1998

Volume

Issue

Pages

323-331

Physical description

Dates

published

1998-02

References

Document Type

Publication order reference

YADDA identifier

bwmeta1.element.bwnjournal-article-appv93z208kz

Identifiers

DOI

10.12693/APhysPolA.93.323