Growth and Structure of Buffer Layers for High Temperature Superconducting Films

• Authors: K. Fröhlich , A. Rosová , D. Machajdík , J. Šouc , A. Figueras , F. Weiss , B. Chenevier , J. Snauwaert
• Languages of publication: EN

Abstracts

EN

We have studied thin CeO_{2} buffer layers prepared by aerosol MOCVD on (11̅02) Al_{2}O_{3} substrate at high deposition temperature, T_{d}= 900°C. A texture analysis by X-ray diffraction showed a high degree of epitaxial character of CeO_{2} films. A study of the microstructure by transmission electron microscopy revealed that the CeO_{2} films are in a relaxed state being composed of slightly misoriented blocks surrounded by dislocations. The films are smooth, giving mean square root values of the surface roughness measured by atomic force microscopy up to 1 nm.

Keywords

EN

68.55.Jk

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1997
• Volume: 92
• Issue: 1
• Pages: 255-258

Dates

published

1997-07

Contributors

author

K. Fröhlich

• Institute of Electrical Engineering, SAS, 842 39 Bratislava, Slovakia

author

A. Rosová

• Institute of Electrical Engineering, SAS, 842 39 Bratislava, Slovakia

author

D. Machajdík

• Institute of Electrical Engineering, SAS, 842 39 Bratislava, Slovakia

author

J. Šouc

• Institute of Electrical Engineering, SAS, 842 39 Bratislava, Slovakia

author

A. Figueras

• Institut de Ciencia de Materials, CSIC, 08193-Bellaterra, Barcelona, Spain

author

F. Weiss

• LMGP, ENSPG, BP 46, 38402 Saint Martin d'Heres, France

author

B. Chenevier

• LMGP, ENSPG, BP 46, 38402 Saint Martin d'Heres, France

author

J. Snauwaert

• Katholieke Univ. Leuven, Celestijnenlaan 200 D, 3001 Leuven, Belgium