X-Ray Diffraction Investigations of NdGaO_{3} Single Crystal

• Authors: K. Mazur , J. Sass , W. Giersz , P. Reiche , N. Schell
• Languages of publication: EN

Abstracts

EN

Neodymium gallium perovskite single crystals grown with the Czochralski method were examined with several complementary X-ray methods. By means of X-ray diffraction topography and reciprocal space diagram the structural perfection and crystal homogeneity of the studied wafers were determined. Additionally, the results of the X-ray reflectometry investigations of the surface perfection after the mechanochemical treatment are presented.

Keywords

EN

81.10.Fq; 61.50.Ks; 68.35.Bs

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1997
• Volume: 92
• Issue: 1
• Pages: 226-230

Dates

published

1997-07

Contributors

author

K. Mazur

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

J. Sass

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

W. Giersz

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

P. Reiche

• Institut für Kristallzüchtung, Rudower Chaussee 6, 12-489 Berlin, Germany

author

N. Schell

• Institut für Ionenstrahlphysik und Materialforschung des Forschungszentrum Rossendorf, 01314 Dresden, Germany