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1997 | 92 | 1 | 226-230
Article title

X-Ray Diffraction Investigations of NdGaO_{3} Single Crystal

Content
Title variants
Languages of publication
EN
Abstracts
EN
Neodymium gallium perovskite single crystals grown with the Czochralski method were examined with several complementary X-ray methods. By means of X-ray diffraction topography and reciprocal space diagram the structural perfection and crystal homogeneity of the studied wafers were determined. Additionally, the results of the X-ray reflectometry investigations of the surface perfection after the mechanochemical treatment are presented.
Keywords
EN
Publisher

Year
Volume
92
Issue
1
Pages
226-230
Physical description
Dates
published
1997-07
Contributors
author
  • Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland
author
  • Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland
author
  • Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland
author
  • Institut für Kristallzüchtung, Rudower Chaussee 6, 12-489 Berlin, Germany
author
  • Institut für Ionenstrahlphysik und Materialforschung des Forschungszentrum Rossendorf, 01314 Dresden, Germany
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv92z131kz
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