Optical Methods in Characterization of HTSC Thin Film Substrates

• Authors: W. Ryba-Romanowski
• Languages of publication: EN

Abstracts

EN

Short overview of optical methods which proved to be useful in the characterization of HTSC thin film substrates is presented. Preliminary tests in polariscopic arrangements, interferometric measurements, optical absorption and emission spectroscopy reveal macroscopic deficiencies of the crystal. Intentionally introduced impurity ions serve as probes of a local strength and symmetry of the crystal field. Results of optical study of SrLaGaO_{4} and SrLaAlO_{4} crystals are presented and discussed.

Keywords

EN

78.55.Hx; 42.70.Hj

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1997
• Volume: 92
• Issue: 1
• Pages: 135-138

Dates

published

1997-07

Contributors

author

W. Ryba-Romanowski

• Institute of Low Temperature and Structure Research, Polish Academy of Sciences, 50-950 Wrocław, P.O. Box 937, Poland