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1997 | 92 | 1 | 135-138
Article title

Optical Methods in Characterization of HTSC Thin Film Substrates

Content
Title variants
Languages of publication
EN
Abstracts
EN
Short overview of optical methods which proved to be useful in the characterization of HTSC thin film substrates is presented. Preliminary tests in polariscopic arrangements, interferometric measurements, optical absorption and emission spectroscopy reveal macroscopic deficiencies of the crystal. Intentionally introduced impurity ions serve as probes of a local strength and symmetry of the crystal field. Results of optical study of SrLaGaO_{4} and SrLaAlO_{4} crystals are presented and discussed.
Keywords
EN
Publisher

Year
Volume
92
Issue
1
Pages
135-138
Physical description
Dates
published
1997-07
Contributors
  • Institute of Low Temperature and Structure Research, Polish Academy of Sciences, 50-950 Wrocław, P.O. Box 937, Poland
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv92z112kz
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