PL EN


Preferences help
enabled [disable] Abstract
Number of results
1997 | 91 | 5 | 1015-1019
Article title

Synchrotron White Beam Topographic Studies of Gallium Arsenide Crystals

Content
Title variants
Languages of publication
EN
Abstracts
EN
A series of samples cut out from different types of gallium arsenide crystals with low dislocation density were studied by means of white beam synchrotron topography. The investigation was performed with transmission and back-reflection projection methods and transmission section method. Some of the topographs in transmission geometry provided a very high sensitivity suitable for revealing small precipitates. The transmission section images significantly differed depending on the wavelength and absorption. In some cases a distinct Pendellösung fringes and fine details of dislocation and precipitates images were observed. It was possible to reproduce the character of these images by means of numerical simulation based on integration of Takagi-Taupin equations. Due to more convenient choice of radiation, synchrotron back-reflection projection topography provided much better visibility of dislocations than analogous methods realized with conventional X-ray sources.
Keywords
EN
Publisher

Year
Volume
91
Issue
5
Pages
1015-1019
Physical description
Dates
published
1997-05
Contributors
  • Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland
author
  • Institute of Atomic Energy, 05-400 Otwock-Świerk, Poland
author
  • HASYLAB at DESY, Notkestraße 85, 22603 Hamburg, Germany
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv91z530kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.