Integral Structure Perfection Diagnostics of Single Crystals Using Two Wavelengths of X-Ray Spectrum

• Authors: L. Datsenko , S. Krasulya , V. Machulin , J. Auleytner , V. Khrupa
• Languages of publication: EN

Abstracts

EN

A new approach to determination of microdefect structure parameters by means of single crystal diffractometer is proposed. The approach is based on the measurements of the integral reflectivity of a sample for two selected X-ray wavelengths providing with the approximations of thin and thick crystal, respectively.

Keywords

EN

81.40.-z; 61.10.-i

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1997
• Volume: 91
• Issue: 5
• Pages: 935-938

Dates

published

1997-05

Contributors

author

L. Datsenko

• Institute of Semiconductor Physics, National Academy of Sciences of Ukraine Kiev, Ukraine

author

S. Krasulya

• Institute of Semiconductor Physics, National Academy of Sciences of Ukraine Kiev, Ukraine

author

V. Machulin

• Institute of Semiconductor Physics, National Academy of Sciences of Ukraine Kiev, Ukraine

author

J. Auleytner

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

V. Khrupa

• Department of Physics, Science Laboratories, University of Durham Durham, South Road, DH1 3LE, U.K.