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1997 | 91 | 5 | 935-938
Article title

Integral Structure Perfection Diagnostics of Single Crystals Using Two Wavelengths of X-Ray Spectrum

Content
Title variants
Languages of publication
EN
Abstracts
EN
A new approach to determination of microdefect structure parameters by means of single crystal diffractometer is proposed. The approach is based on the measurements of the integral reflectivity of a sample for two selected X-ray wavelengths providing with the approximations of thin and thick crystal, respectively.
Keywords
EN
Publisher

Year
Volume
91
Issue
5
Pages
935-938
Physical description
Dates
published
1997-05
Contributors
author
  • Institute of Semiconductor Physics, National Academy of Sciences of Ukraine Kiev, Ukraine
author
  • Institute of Semiconductor Physics, National Academy of Sciences of Ukraine Kiev, Ukraine
author
  • Institute of Semiconductor Physics, National Academy of Sciences of Ukraine Kiev, Ukraine
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland
author
  • Department of Physics, Science Laboratories, University of Durham Durham, South Road, DH1 3LE, U.K.
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv91z517kz
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