Energy-Dispersive X-Ray Reflectometry and X-Ray Grazing Incidence Diffraction from Organic Multilayers
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The installation of the wavelength shifter at the BESSY I storage ring in Berlin makes it possible to apply the synchrotron radiation for white beam investigations of organic multilayers. Considering the energy characteristic of the synchroton radiation source and the absorbance of the beryllium window the synchrotron radiation can be used outside the UHV system for X-ray reflectometry and X-ray diffuse scattering between about 3 keV and 25 keV. Between 3 and 10 keV the synchrotron radiation intensity is high enough to realize the grazing incidence diffraction mode in order to get in-plane information. The capability of the methods is demonstrated at the example of a Pb-stearate multilayer covered by a thin polyelectrolytic polymer layer.
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