STM/AFM Observations of Co/Cu Magnetic Multilayers

• Authors: M. Aleszkiewicz , R. Kalinowski , R. Czajka , W. Polewska , A. Wawro , L.T. Baczewski , J. Raułuszkiewicz
• Languages of publication: EN

Abstracts

EN

UHV deposited magnetic Co/Cu multilayers were investigated by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Surface of the sample i.e. upper covering layer in "plane" configuration and individual sublayers in "cross-section" configuration were investigated. A possibility of structure characterization of metallic multilayers by STM and AFM in the cross-section configuration is demonstrated.

Keywords

EN

61.16.Ch; 68.65.+g; 68.55.Jk

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1997
• Volume: 91
• Issue: 2
• Pages: 311-314

Dates

published

1997-02

Contributors

author

M. Aleszkiewicz

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

R. Kalinowski

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

R. Czajka

• Institute of Physics, Poznań Technical University, Piotrowo 3, 60-965 Poznań, Poland

author

W. Polewska

• Institute of Physics, Poznań Technical University, Piotrowo 3, 60-965 Poznań, Poland

author

A. Wawro

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

L.T. Baczewski

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

author

J. Raułuszkiewicz

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland