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1997 | 91 | 2 | 311-314
Article title

STM/AFM Observations of Co/Cu Magnetic Multilayers

Content
Title variants
Languages of publication
EN
Abstracts
EN
UHV deposited magnetic Co/Cu multilayers were investigated by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Surface of the sample i.e. upper covering layer in "plane" configuration and individual sublayers in "cross-section" configuration were investigated. A possibility of structure characterization of metallic multilayers by STM and AFM in the cross-section configuration is demonstrated.
Keywords
EN
Year
Volume
91
Issue
2
Pages
311-314
Physical description
Dates
published
1997-02
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv91z217kz
Identifiers
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