High-Quality Ni-Fe/Cu Multilayer Films with Antiferromagnetic Coupling

• Authors: F. Stobiecki , J. Dubowik , T. Luciński , B. Szymański , H. Rohrmann , K. Röll , M. Schmidt
• Languages of publication: EN

Abstracts

EN

We report structural and magnetic properties of Ni_{83}Fe_{17}/Cu multilayer films with various buffer layer and sublayer thicknesses of copper d_{Cu} and Permalloy d_{Py} deposited by face-to-face sputtering. The following features prove a good quality of our films: a well-layered structure, complete antiferromagnetic coupling with a low coupling strength (2×10^{-5} J/m^{2} for d_{Cu}=1 nm and 10^{-6} J/m^{^2} for d_{Cu}=2.1 nm) and a low coercive field which make them attractive for possible applications as giant magnetoresistance sensors.

Keywords

EN

75.50.Tt; 76.50.+g

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1997
• Volume: 91
• Issue: 2
• Pages: 277-280

Dates

published

1997-02

Contributors

author

F. Stobiecki

• Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland

author

J. Dubowik

• Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland

author

T. Luciński

• Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland

author

B. Szymański

• Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland

author

H. Rohrmann

• University of Kassel, FB Physik, 34109 Kassel, Germany

author

K. Röll

• University of Kassel, FB Physik, 34109 Kassel, Germany

author

M. Schmidt

• Institute of Physics, A. Mickiewicz University, 60-780 Poznań, Poland