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1997 | 91 | 2 | 277-280
Article title

High-Quality Ni-Fe/Cu Multilayer Films with Antiferromagnetic Coupling

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EN
Abstracts
EN
We report structural and magnetic properties of Ni_{83}Fe_{17}/Cu multilayer films with various buffer layer and sublayer thicknesses of copper d_{Cu} and Permalloy d_{Py} deposited by face-to-face sputtering. The following features prove a good quality of our films: a well-layered structure, complete antiferromagnetic coupling with a low coupling strength (2×10^{-5} J/m^{2} for d_{Cu}=1 nm and 10^{-6} J/m^{^2} for d_{Cu}=2.1 nm) and a low coercive field which make them attractive for possible applications as giant magnetoresistance sensors.
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EN
Publisher

Year
Volume
91
Issue
2
Pages
277-280
Physical description
Dates
published
1997-02
Contributors
author
  • Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland
author
  • University of Kassel, FB Physik, 34109 Kassel, Germany
author
  • University of Kassel, FB Physik, 34109 Kassel, Germany
author
  • Institute of Physics, A. Mickiewicz University, 60-780 Poznań, Poland
References
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Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv91z209kz
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