Dependence of Bilinear and Biquadratic Interlayer coupling on Thickness of Magnetic Films

• Authors: J. Barnaś
• Languages of publication: EN

Abstracts

EN

The dependence of bilinear and biquadratic interlayer coupling on the thickness of magnetic films is analysed for a trilayer structure with specular reflection at the outer surfaces. It is shown that the oscillation periods corresponding to the case where the thickness of one of the two magnetic films is constant, while that of the second one is varied, can be different from the oscillation periods in the case where the thicknesses of both magnetic films vary simultaneously. The nonoscillatory component of the coupling parameter is shown to be weakly dependent on the thickness of the magnetic films.

Keywords

EN

75.30.Et

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1997
• Volume: 91
• Issue: 2
• Pages: 257-260

Dates

published

1997-02

Contributors

author

J. Barnaś

• Institute of Physics, A. Mickiewicz University, Matejki 48/49, 60-769 Poznań, Poland