Cd_{1-x}Fe_{x}Se/Fe Interface Formation Observed by Means of Photoemission Spectroscopy

• Authors: E. Guziewicz , B. Orłowski , B. Kowalski , N. Barrett , D. Martinotti , C. Guillot , J. Lacharme , C. Sebenne
• Languages of publication: EN

Abstracts

EN

We present a new outlook at the study of metal-semiconductor interface formation. A resonant photoemission spectroscopy tuned to the Fe 3p-3d transition (56 eV) was used to investigate the changes after sequential deposition of Fe atoms on freshly cleaved Cd_{0.86}Fe_{0.14}Se crystal surface. In the first stages (0.6-4 ML) of Fe deposition the contribution of Fe 3d electrons to the valence band grows up markedly indicating the increase in Fe content in the Cd_{0.86}Fe_{0.14}Se crystal surface region. When the amount of Fe exceed 40 ML the resonant photoemission spectra became similar to the Fe metal with some contribution of the ternary crystal substrate.

Keywords

EN

73.20.-r; 79.60.Jv

Discipline

• 73.20.-r: Electron states at surfaces and interfaces
• 79.60.Jv: Interfaces; heterostructures; nanostructures

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1996
• Volume: 90
• Issue: 4
• Pages: 805-808

Dates

published

1996-10

Contributors

author

E. Guziewicz

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

B. Orłowski

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

B. Kowalski

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

N. Barrett

• Laboratoire pour l'Utilisation du Rayonnement Electromagnetic, Bat. 209 D, Centre Universitaire Paris-Sud, 91405 Orsay Cedex, France
• DRECAM-SRSIM, CE Saclay 91191 Gif sur Yvette, France

author

D. Martinotti

• Laboratoire pour l'Utilisation du Rayonnement Electromagnetic, Bat. 209 D, Centre Universitaire Paris-Sud, 91405 Orsay Cedex, France
• DRECAM-SRSIM, CE Saclay 91191 Gif sur Yvette, France

author

C. Guillot

• Laboratoire pour l'Utilisation du Rayonnement Electromagnetic, Bat. 209 D, Centre Universitaire Paris-Sud, 91405 Orsay Cedex, France
• DRECAM-SRSIM, CE Saclay 91191 Gif sur Yvette, France

author

J. Lacharme

• Laboratoire de Physique des Solides, ERS 113 au CNRS, Case 79, Université Pierre et Marie Curie, 75252 Paris Cedex 05, France

author

C. Sebenne

• Laboratoire de Physique des Solides, ERS 113 au CNRS, Case 79, Université Pierre et Marie Curie, 75252 Paris Cedex 05, France

Identifiers

DOI

10.12693/APhysPolA.90.805