Effect of Interface Roughness on Resonant Tunnelling in Double-Barrier Heterostructures

T. Figielski; T. Wosiński; A. Mąkosa

doi:10.12693/APhysPolA.90.777

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Journal

Acta Physica Polonica A

1996 | 90 | 4 | 777-780

Article title

Effect of Interface Roughness on Resonant Tunnelling in Double-Barrier Heterostructures

Authors

T. Figielski , T. Wosiński , A. Mąkosa

Content

http://przyrbwn.icm.edu.pl/APP/PDF/90/a090z4p26.pdf [remote]

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Languages of publication

Abstracts

We argue that the well-boundary roughness in a double-barrier heterostructure induces subsidiary subbands in the quantum well which, in turn, lead to the appearance of a broad shoulder beyond the principal resonance peak in the current-voltage characteristics.

Keywords

73.40.Gk 85.30.Mn 68.35.Ct

Publisher

Institute of Physics, Polish Academy of Sciences

Journal

Acta Physica Polonica A

Year

1996

Volume

Issue

Pages

777-780

Physical description

Dates

published

1996-10

References

Document Type

Publication order reference

YADDA identifier

bwmeta1.element.bwnjournal-article-appv90z426kz

Identifiers

DOI

10.12693/APhysPolA.90.777