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Number of results
1996 | 90 | 1 | 83-92

Article title

Erbium Luminescence in Silicon

Content

Title variants

Languages of publication

EN

Abstracts

EN
We report on high resolution photoluminescence investigations of Er-implanted Si and demonstrate the variety of Er centers or complexes with impurities and native Si-defects formed depending on the processing parameters. These centers are shown to differ in the efficiency of excitation transfer as well as high temperature photoluminescence yield. The mechanisms responsible for the photoluminescence quenching at different temperature regimes are discussed.

Keywords

EN

Year

Volume

90

Issue

1

Pages

83-92

Physical description

Dates

published
1996-07

Contributors

  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland
author
  • Johannes Kepler Universität, 4040 Linz, Austria
  • Johannes Kepler Universität, 4040 Linz, Austria

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv90z108kz
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