Optical Characterization of MBE-Grown Cd_{1-x}Mn_{x}Te Layers by Raman Spectroscopy

• Authors: W. Szuszkiewicz , E. Dynowska , E. Janik , G. Karczewski , T. Wojtowicz , J. Kossut , M. Jouanne
• Languages of publication: EN

Abstracts

EN

In this paper we discuss a possibility of an optical characterization of thin semiconductor epilayers by Raman scattering measurements. As an example zinc blende Cd_{1-x}Mn_{x}Te epilayers (0.66 ≤ x ≤ 1.0) have been grown by molecular beam epitaxy method and investigated by Raman scattering and X-ray diffraction. Information resulting from both methods is compared and discussed.

Keywords

EN

63.20.-e; 75.50.Pp; 78.30.-j

Discipline

• 78.30.-j: Infrared and Raman spectra(for vibrational states in crystals and disordered systems, see 63.20.-e and 63.50.-x, respectively; for Raman spectra of superconductors, see 74.25.nd)
• 63.20.-e: Phonons in crystal lattices(for phonons in superconductors, see 74.25.Kc; see also 43.35.Gk Phonons in crystal lattice, quantum acoustics—in Acoustics Appendix)
• 75.50.Pp: Magnetic semiconductors

• Journal: Acta Physica Polonica A
• Year: 1996
• Volume: 89
• Issue: 3
• Pages: 335-340

Dates

published

1996-03

Contributors

author

W. Szuszkiewicz

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warszawa, Poland

author

E. Dynowska

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warszawa, Poland

author

E. Janik

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warszawa, Poland

author

G. Karczewski

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warszawa, Poland

author

T. Wojtowicz

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warszawa, Poland

author

J. Kossut

• Institute of Physics, Polish Academy of Sciences Al. Lotników 32/46, 02-668 Warszawa, Poland

author

M. Jouanne

• Laboratoire de Physique des Solides, Université Paris VI, France

Identifiers

DOI

10.12693/APhysPolA.89.335