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1996 | 89 | 3 | 323-328
Article title

Oscillations in Reflectivity of Samples with X-ray Waveguide Layers

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EN
Abstracts
EN
The glancing-angle reflectivity profiles in samples containing an X-ray waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discussion is extended to the structures composed of more than one layer. Experimental reflectivity spectra recorded with Cu K_{α} radiation are compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non-resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applications of the reflectivity spectra to the studies of structure of thin layers is done.
Keywords
EN
Contributors
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
  • Istituto di Elettronica dello Stato Solido CNR, V. Cineto Romano 42, Roma, Italy
author
  • Sincrotrone Trieste, Padriciano 99, 34012 Trieste, Italy
author
  • Sincrotrone Trieste, Padriciano 99, 34012 Trieste, Italy
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
References
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Publication order reference
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YADDA identifier
bwmeta1.element.bwnjournal-article-appv89z305kz
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