Oscillations in Reflectivity of Samples with X-ray Waveguide Layers

• Authors: J. Pełka , S. Lagomarsino , S. Di Fonzo , W. Jark , J. Domagała
• Languages of publication: EN

Abstracts

EN

The glancing-angle reflectivity profiles in samples containing an X-ray waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discussion is extended to the structures composed of more than one layer. Experimental reflectivity spectra recorded with Cu K_{α} radiation are compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non-resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applications of the reflectivity spectra to the studies of structure of thin layers is done.

Keywords

EN

68.65.+g; 78.20.Ci

Discipline

• 78.20.Ci: Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1996
• Volume: 89
• Issue: 3
• Pages: 323-328

Dates

published

1996-03

Contributors

author

J. Pełka

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

S. Lagomarsino

• Istituto di Elettronica dello Stato Solido CNR, V. Cineto Romano 42, Roma, Italy

author

S. Di Fonzo

• Sincrotrone Trieste, Padriciano 99, 34012 Trieste, Italy

author

W. Jark

• Sincrotrone Trieste, Padriciano 99, 34012 Trieste, Italy

author

J. Domagała

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

Identifiers

DOI

10.12693/APhysPolA.89.323