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Number of results
1995 | 88 | 5 | 877-880

Article title

Optically Active Centers in Er-Implanted Silicon

Content

Title variants

Languages of publication

EN

Abstracts

EN
We show that of all the optically active Er centers in silicon found after ion implantation and optimum annealing (900°C) the isolated cubic interstitial Er is the dominant PL center above 100 K. At lower anneal temperatures ( ≈ 600°C) with later rapid thermal anneal at 900°C oxygen related centers also emit.

Keywords

EN

Year

Volume

88

Issue

5

Pages

877-880

Physical description

Dates

published
1995-11

Contributors

  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institut für Experimentalphysik, Johannes Kepler Universität, 4040 Linz-Auhof, Austria
author
  • Institut für Experimentalphysik, Johannes Kepler Universität, 4040 Linz-Auhof, Austria
  • Institut für Experimentalphysik, Johannes Kepler Universität, 4040 Linz-Auhof, Austria
author
  • Department of Electronic and Electrical Engineering, University of Surrey, Guildford, Surrey GU2 5XH, UK
author
  • Department of Electronic and Electrical Engineering, University of Surrey, Guildford, Surrey GU2 5XH, UK

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv88z514kz
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