Real Time Imaging of Propagating High Field Domains in Semi-Insulating GaAs
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With a newly developed technique, we measure voltage, electric field and charge distribution of high field domains in semi-insulating GaAs under high electric bias. Based on these new quantitative data resolved in time and space, which are synchronized with the current pulses, we confront the generally accepted model which explains the domain formation with field enhanced trapping from EL2.
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