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Number of results
1995 | 88 | 4 | 795-798
Article title

Lattice Parameter Relaxation during MBE of ZnTe/Cd_{1-x}Zn_{x}Te/Cd_{0.5}Zn_{0.5}Te Buffer Layers by RHLED and HRTEM

Content
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Languages of publication
EN
Abstracts
EN
The dynamics of the lattice relaxation processes were investigated us­ing a reflection of a high energy electron diffraction analysis system dur­ing growth by molecular beam epitaxy of ZnTe/Cd_{1-x}Ζn_{x}Te/Cd_{0.5}Mn_{0.5}Te buffers on GaAs substrates. The variation of the lattice parameter recorded by the high energy electron diffraction during the growth was later confirmed by an analysis of high resolution transmission electron microscopy images. We report also on an observation of oscillations of the lattice parameter during the deposition of several first layers of ZnTe on CdTe.
Keywords
EN
Publisher

Year
Volume
88
Issue
4
Pages
795-798
Physical description
Dates
published
1995-10
Contributors
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Laboratoire de Physique du Solide, CNRS-ESPCI, Rue Vauquelin,7523l Paris, France
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Laboratoire de Physique du Solide, CNRS-ESPCI, Rue Vauquelin,7523l Paris, France
author
  • Laboratoire de Physique du Solide, CNRS-ESPCI, Rue Vauquelin,7523l Paris, France
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv88z444kz
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