Defect Profile Induced by Friction and Wear Processes Detected by Positron Annihilation Method

• Authors: J. Dryzek , E. Dryzek , B. Cleff
• Languages of publication: EN

Abstracts

EN

The positron annihilation studies of defect profile in Cu samples whose surfaces were exposed to the friction and wear processes are presented. The values of the S-parameter and its dependences on the depth from the Cu surface are the functions of the value of the load applied in the sliding contact between two metals. It indicates possibilities of applying the presented measurement method in the industry.

Keywords

EN

78.70.Bj

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1995
• Volume: 88
• Issue: 1
• Pages: 129-133

Dates

published

1995-07

Contributors

author

J. Dryzek

• Institute of Nuclear Physics, Radzikowskiego 152, 31-342 Kraków, Poland

author

E. Dryzek

• Institute of Nuclear Physics, Radzikowskiego 152, 31-342 Kraków, Poland

author

B. Cleff

• Institute of Nuclear Physics, University of Münster, Wilhelm-Klemm-Strasse 9, D-4400 Münster, Germany