EN
The peak coincidence counting rate F(T) was measured for Sn-54wt%In alloy at the temperature range from room temperature to 400°C. It was observed that for both heating and cooling run, F(Τ) parameter changes in the liquid phase. These changes were related to disintegration of SnII microcrystals. From a simple trapping model the defect disintegration enthalpy, H_{1}, was calculated. For heating and cooling run, the value of H_{1} was 0.53 ± 0.03 eV and 0.67 ± 0.07 eV, respectively. For well-annealed and cold rolled samples we find only one component, equal 200 ps, in the lifetime spectrum.