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Number of results
1995 | 87 | 2 | 403-406

Article title

Epitaxial Layers Versus Bulk Single Crystals of GaN. Temperature Studies of Lattice Parameters and Energy Gap

Content

Title variants

Languages of publication

EN

Abstracts

EN
Gallium nitride epitaxial layer grown by molecular beam epitaxy and bulk crystal grown at high pressure were examined by using X-ray diffrac­tion methods, and by optical absorption at a wide temperature range. The free electron concentration was 6 × 10^{17} cm^{-3} for the layer and about 5 × 10^{19} cm^{-3} for the bulk crystal. The experiments revealed a different po­sition of the absorption edge and its temperature dependence for these two kinds of samples. The structural examinations proved a significantly higher crystallographic quality of the bulk sample. However, the lattice constants of the samples were nearly the same. This indicated that a rather different electron concentration was responsible for the different optical properties via Burstein-Moss effect.

Keywords

EN

Year

Volume

87

Issue

2

Pages

403-406

Physical description

Dates

published
1995-02

Contributors

author
  • High Pressure Research Center "Unipress", Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warszawa, Poland
author
  • High Pressure Research Center "Unipress", Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warszawa, Poland
  • High Pressure Research Center "Unipress", Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warszawa, Poland
author
  • High Pressure Research Center "Unipress", Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warszawa, Poland
author
  • High Pressure Research Center "Unipress", Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warszawa, Poland
author
  • High Pressure Research Center "Unipress", Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warszawa, Poland
author
  • High Pressure Research Center "Unipress", Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warszawa, Poland
author
  • High Pressure Research Center "Unipress", Polish Academy of Sciences, Sokołowska 29/37, 01-142 Warszawa, Poland
author
  • Boston University, Molecular Beam Epitaxy Laboratory, Department of Electrical, Computer and System Engineering, Boston MA 02215, USA

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv87z225kz
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