Electrical and Optical Characterization of Nanostructures

• Authors: E. Gornik , J. Smoliner , V. Rosskopf
• Languages of publication: EN

Abstracts

EN

The characterization of nanostructures is a topic of vital interest, since the dimensions of commercially available semiconductor devices are now in a range, where quantum size effects become evident. In this paper, various methods are presented to characterize low-dimensional structures. Magnetic depopulation, tunneling, far infrared transmission, photo-conductivity and magnetophonon resonances are used to determine the low-dimensional sub-band energies. For each method, the special features are discussed and it is demonstrated that the different methods yield different, complementary information.

Keywords

EN

73.20.Dx

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1995
• Volume: 87
• Issue: 1
• Pages: 119-131

Dates

published

1995-01

Contributors

author

E. Gornik

• Technische Universität Wien, Institut für Festkörperelektronik 362, Gußhausstraße 25-29, 1040 Wien, Austria

author

J. Smoliner

• Technische Universität Wien, Institut für Festkörperelektronik 362, Gußhausstraße 25-29, 1040 Wien, Austria

author

V. Rosskopf

• Technische Universität Wien, Institut für Festkörperelektronik 362, Gußhausstraße 25-29, 1040 Wien, Austria

Identifiers

DOI

10.12693/APhysPolA.87.119