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1995 | 87 | 1 | 119-131
Article title

Electrical and Optical Characterization of Nanostructures

Content
Title variants
Languages of publication
EN
Abstracts
EN
The characterization of nanostructures is a topic of vital interest, since the dimensions of commercially available semiconductor devices are now in a range, where quantum size effects become evident. In this paper, various methods are presented to characterize low-dimensional structures. Magnetic depopulation, tunneling, far infrared transmission, photo-conductivity and magnetophonon resonances are used to determine the low-dimensional sub-band energies. For each method, the special features are discussed and it is demonstrated that the different methods yield different, complementary information.
Keywords
EN
Publisher

Year
Volume
87
Issue
1
Pages
119-131
Physical description
Dates
published
1995-01
Contributors
author
  • Technische Universität Wien, Institut für Festkörperelektronik 362, Gußhausstraße 25-29, 1040 Wien, Austria
author
  • Technische Universität Wien, Institut für Festkörperelektronik 362, Gußhausstraße 25-29, 1040 Wien, Austria
author
  • Technische Universität Wien, Institut für Festkörperelektronik 362, Gußhausstraße 25-29, 1040 Wien, Austria
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv87z112kz
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