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1995 | 87 | 1 | 17-24
Article title

Application of Synchrotron Radiation to the Atomic and Electronic Structure of Semiconductors

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Content
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Languages of publication
EN
Abstracts
EN
A brief review of the main experimental techniques exploiting syn­chrotron radiation in semiconductor physics is attempted. Topics empha­sized include the study of surface and interface phenomena, such as sur­face structural properties (e.g. surface reconstruction) by X-ray diffraction, surface dynamical properties (e.g. adsorbate vibrational amplitudes) by the X-ray standing waves technique, etc. This review emphasizes brilliance (the phase-space density of photons) as the main figure of merit for many ex­perimental techniques applicable to research in semiconductor physics. Ex­amples of experiments made possible by the so-called "third generation", high-brilliance synchrotron sources are presented.
Keywords
EN
Year
Volume
87
Issue
1
Pages
17-24
Physical description
Dates
published
1995-01
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv87z102kz
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