PL EN


Preferences help
enabled [disable] Abstract
Number of results
1994 | 86 | 5 | 853-859
Article title

Signal Photoelectron Yield Dependence on the X-Ray Angle of Incidence

Content
Title variants
Languages of publication
EN
Abstracts
EN
The photoelectron emission from solids irradiated by X-rays was described by the analytical theory of electron transport and simulated by the Monte Carlo technique. The medium energy electron transport problem is treated by means of a Boltzmann type kinetic equation satisfying appropriate boundary conditions. The solution of the transport equation was obtained in the transport approximation based on the generalized radiative field similarity principle. Simple and reliable formalism was derived for both the differential and the total photoelectron yields. The dependence of the photoelectron yield on the X-ray incidence angle and the "flattening" effect of multiple elastic scattering on the angular distribution of electrons leaving the target are analysed in detail. The photoelectron yields and angular distributions calculated by the Monte Carlo algorithm, based on a realistic differential elastic scattering cross-section, are in good agreement with the results found from analytical theory. It is shown that main characteristics of the photoelectron emission are determined primarily by two parameters: the inelastic and the transport mean free paths.
Keywords
EN
Publisher

Year
Volume
86
Issue
5
Pages
853-859
Physical description
Dates
published
1994-11
Contributors
author
  • Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01-224 Warszawa, Poland
  • Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01-224 Warszawa, Poland
  • Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01-224 Warszawa, Poland
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z524kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.