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Number of results
1994 | 86 | 5 | 771-785

Article title

Core Level Spectroscopy at Surfaces and Interfaces

Authors

Content

Title variants

Languages of publication

EN

Abstracts

EN
This article provides the basics of core level photoelectron spectroscopy, together with applications in the area of semiconductors. The use of synchrotron radiation is emphasized, particularly the opportunities that are opening up at the new, third generation light sources.

Keywords

EN

Year

Volume

86

Issue

5

Pages

771-785

Physical description

Dates

published
1994-11

Contributors

author
  • IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, USA

References

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv86z515kz
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