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1994 | 86 | 5 | 771-785
Article title

Core Level Spectroscopy at Surfaces and Interfaces

Authors
Content
Title variants
Languages of publication
EN
Abstracts
EN
This article provides the basics of core level photoelectron spectroscopy, together with applications in the area of semiconductors. The use of synchrotron radiation is emphasized, particularly the opportunities that are opening up at the new, third generation light sources.
Keywords
EN
Publisher

Year
Volume
86
Issue
5
Pages
771-785
Physical description
Dates
published
1994-11
Contributors
author
  • IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, USA
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z515kz
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