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1994 | 86 | 5 | 645-661
Article title

X-Ray Absorption Spectroscopy

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Content
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EN
Abstracts
EN
X-ray absorption spectroscopy, today widely used as a tool for structural investigations, is described. Theoretically it is shown that above an absorption edge the absorption coefficient is well approximated by a sum of terms, each one describing a particular path followed by the photoelectron outgoing from the atom. Such geometrical feature allows to use X-ray absorption spectroscopy for structural investigations. The data analysis procedures are outlined. Applications of the single scattering region, generally known as EXAFS to semiconductors alloys, to metallic clusters and to the crystallization of amorphous metallic glasses are illustrated. Multiple scattering calculations and their relation to experimental spectra is discussed in the case of Mn ions in solution. Application of the multiple scattering to determine the three-body correlation function in a-Si:H is shown.
Keywords
EN
Publisher

Year
Volume
86
Issue
5
Pages
645-661
Physical description
Dates
published
1994-11
Contributors
author
  • Dipartimento di Energetica Universita' de L'Aquila, Roio Monteluco 67100 L'Aquila, Italy and Laboratori Nazionali di Frascati, via E. Fermi 40, 00044 Frascati, Italy
References
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Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z501kz
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