Interpretation of Differential Anomalous X-Ray Scattering Data for Amorphous Cd-As

• Authors: A. Burian , P. Lecante , A. Mosset , J. Galy , J.M. Tonnerre , D. Raoux
• Languages of publication: EN

Abstracts

EN

The computational procedure, based on Warren's exact method for an amorphous sample with more than one atom, was developed to obtain the short-range order structural parameters from the differential anomalous X-ray scattering data, collected using the synchrotron radiation. The experimental differential radial distribution functions were fitted with the true distribution functions expressed in an analytical form and broadened by convolution with the pair functions. It was found that atoms in the amorphous Cd-As films remain almost tetrahedrally coordinated and the investigated alloys are chemically ordered.

Keywords

EN

78.70.Dm; 61.10.-i

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1994
• Volume: 86
• Issue: 4
• Pages: 633-640

Dates

published

1994-10

Contributors

author

A. Burian

• Department of Solid State Physics, Polish Academy of Sciences, Wandy 3, 41-800 Zabrze, Poland

author

P. Lecante

• CEMES-LOE/CNRS, 29 rue J. Marvig, BP 4347, 31055 Toulouse Cedex, France

author

A. Mosset

• CEMES-LOE/CNRS, 29 rue J. Marvig, BP 4347, 31055 Toulouse Cedex, France

author

J. Galy

• CEMES-LOE/CNRS, 29 rue J. Marvig, BP 4347, 31055 Toulouse Cedex, France

author

J.M. Tonnerre

• Laboratoire de Cristallographie, UPR CNRS 503, BP 166X, 38042 Grenoble Cedex, France

author

D. Raoux

• Laboratoire de Cristallographie, UPR CNRS 503, BP 166X, 38042 Grenoble Cedex, France