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1994 | 86 | 4 | 633-640
Article title

Interpretation of Differential Anomalous X-Ray Scattering Data for Amorphous Cd-As

Content
Title variants
Languages of publication
EN
Abstracts
EN
The computational procedure, based on Warren's exact method for an amorphous sample with more than one atom, was developed to obtain the short-range order structural parameters from the differential anomalous X-ray scattering data, collected using the synchrotron radiation. The experimental differential radial distribution functions were fitted with the true distribution functions expressed in an analytical form and broadened by convolution with the pair functions. It was found that atoms in the amorphous Cd-As films remain almost tetrahedrally coordinated and the investigated alloys are chemically ordered.
Keywords
EN
Publisher

Year
Volume
86
Issue
4
Pages
633-640
Physical description
Dates
published
1994-10
Contributors
author
  • Department of Solid State Physics, Polish Academy of Sciences, Wandy 3, 41-800 Zabrze, Poland
author
  • CEMES-LOE/CNRS, 29 rue J. Marvig, BP 4347, 31055 Toulouse Cedex, France
author
  • CEMES-LOE/CNRS, 29 rue J. Marvig, BP 4347, 31055 Toulouse Cedex, France
author
  • CEMES-LOE/CNRS, 29 rue J. Marvig, BP 4347, 31055 Toulouse Cedex, France
author
  • Laboratoire de Cristallographie, UPR CNRS 503, BP 166X, 38042 Grenoble Cedex, France
author
  • Laboratoire de Cristallographie, UPR CNRS 503, BP 166X, 38042 Grenoble Cedex, France
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z422kz
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