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1994 | 86 | 4 | 579-584
Article title

Structure Perfection Diagnostics of Single Crystals by Means of Diffractometry Measurements Using X-Ray Continuous Spectrum

Content
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Languages of publication
EN
Abstracts
EN
Determination of the integral characteristics of structural perfection of a real crystal (i.e. Debye-Waller's static factor e^{-L} and coefficient of absorption lids due to diffuse scattering) is especially expedient using the suitably selected wavelengths of the X-ray continuous spectrum by investigation of the thickness I(t), coordinate I(x) as well as amplitude I(W) dependencies of intensities at Lane or Bragg diffraction. Here W is an amplitude of weak ultrasound vibrations excited in a sample for suppression of the Bragg component of reflectivity.
Keywords
EN
Publisher

Year
Volume
86
Issue
4
Pages
579-584
Physical description
Dates
published
1994-10
Contributors
author
  • Institute of Semiconductor Physics, National Academy of Sciences, Prosp. Nauki 45, 252028 Kiev, Ukraine
author
  • Institute of Semiconductor Physics, National Academy of Sciences, Prosp. Nauki 45, 252028 Kiev, Ukraine
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z413kz
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