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1994 | 86 | 4 | 553-566
Article title

X-Ray Standing Waves: a Powerful Tool for Interface Studies

Content
Title variants
Languages of publication
EN
Abstracts
EN
The X-ray standing wave technique has demonstrated in these last years to be a powerful method in the study of interfaces. In this paper the fundamentals of the technique will be given, together with examples of applications in the field of metal-semiconductor, of buried semiconductor-semiconductor interfaces and in structural studies of Langmuir-Blodgett films.
Keywords
EN
Publisher

Year
Volume
86
Issue
4
Pages
553-566
Physical description
Dates
published
1994-10
Contributors
  • Istituto Elettronica Stato Solido, CNR, V. Cineto Romano, 42 00156 Rome, Italy
author
  • Istituto Elettronica Stato Solido, CNR, V. Cineto Romano, 42 00156 Rome, Italy
author
  • Phys. Dep., Univ. Camerino, 62032 Camerino, Italy
author
  • CNRSM, 72023 Mesagne, Italy
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z410kz
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